Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...

Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...

The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. To ...

Scan insertion to improve test coverage and reduce test pattern volume is very common in today’s DFT tools. All of the major ATPG tool vendors (Synopsys, Cadence, and Mentor) offer this approach in ...

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...

In New test points slash ATPG test pattern count, I described a new type of test point technology used with scan compression for device testing. The key benefit of using test points with embedded ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...