TOKYO, June 29, 2026 — OKI has developed an AI-based inspection technology that reduces the time required for manual checks after automated optical inspection, or AOI, by about 80% for large, ...

Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in diamond and other advanced semiconductor materials. By making it easier to spot ...

Christine Fisher describes her method using mass defect filtering at the data acquisition stage to improve non-targeted PFAS detection in complex food matrices. Christine Fisher from the US FDA ...

“Semiconductor lithography inspection requires reliable detection of small pattern defects such as bridge, burr, pinch, and contamination. In this study, we propose a two-stage vision-language ...

AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.

A new research review looks at how computer vision and machine learning could be used to spot defects in 3D printed concrete. That sounds like a narrow research topic. It isn’t. Construction 3D ...

A stealthy Python-based backdoor framework capable of long-term surveillance and credential theft has been identified targeting Windows systems. According to research from Securonix, the malware, ...

ESC-YOLO-Net is a compact and computationally efficient object detector designed for automated defect inspection on printed circuit boards (PCBs). The proposed framework is developed from the YOLOv10 ...